Aberration-Corrected Transmission Electron Microscopy Reveals Nanoscale Disorder in Bismuth Ferrite Single Crystals
نویسندگان
چکیده
In recent years, in particular after it was demonstrated [2] that thin epitactic films of BFO display extraordinary high values of spontaneous electric polarization, the work on electric and magnetic properties and their coupling concentrated on thin film systems. Also the structure of polarization-domain walls in these films was studied by transmission electron microscopy [e.g. 3-6]. In our work we followed an entirely different approach. It is generally accepted that for a study of the basic, intrinsic physical properties of a material single crystals are required. In fact, compared to thin films there is comparatively little work done on BFO single crystals. And in spite of more than thirty years of BFO research, until recently [7] there was not a single study on single crystals by electron microscopy. Here we give a brief account of the first results obtained on single crystals by aberration-corrected TEM [8]. Our study is typical for the high potential of aberration-corrected high-resolution TEM in the field of modern materials science where structures of atomicto nanoscale may be decisive for physical properties but are not always noticed by non-local techniques.
منابع مشابه
The Co-Au interface in bimetallic nanoparticles: a high resolution STEM study.
We report the formation of Au/Co nanoparticles and their characterization by aberration (Cs) corrected scanning transmission electron microscopy (STEM). The nanoparticles were synthesized by inert gas condensation, forming initially core-shell and bimetallic crystals. However, after thermal treatment at normal atmospheric conditions, the Co nanoparticles changed their morphology into a fine lay...
متن کاملDirect determination of local lattice polarity in crystals.
With current advances in sub-angstrom resolution scanning transmission electron microscopy (STEM), it is now possible to image directly local crystal structures of materials where dramatically different atoms are separated from each other at distances about or less than 1 angstrom. We achieved direct imaging of atomic columns of nitrogen in close proximity to columns of aluminum in wurtzite alu...
متن کاملElectron Microscopy at Very High Resolution
Transmission electron microscopy (TEM) is one of the most frequently used tools for the characterization of nanomaterials. Aberration-correction has revolutionized the field of electron microscopy and now equipment is commercially available providing sub-Gngström resolution and single atom sensitivity for atomic, electronic, and chemical structure analyses. In this entry, aberration-corrected s...
متن کاملDetermination of the 3D shape of a nanoscale crystal with atomic resolution from a single image.
Although the overall atomic structure of a nanoscale crystal is in principle accessible by modern transmission electron microscopy, the precise determination of its surface structure is an intricate problem. Here, we show that aberration-corrected transmission electron microscopy, combined with dedicated numerical evaluation procedures, allows the three-dimensional shape of a thin MgO crystal t...
متن کاملNanostructured Single Crystals Sandwiched between Ordered/Disordered Coily and Rod Brushes
Single crystals of poly(ethylene glycol) (PEG)-b-polystyrene (PS), PEG-b-poly(methyl methacrylate) (PMMA), PEG-b-polycaprolactone (PCL), and polyaniline (PANI)-b-PEG-b-PANI were developed from dilute solutions and thin molten films using self-seeding methodology. The PS and PMMA grafted chains were categorized in disordered nano-brushes; however, the PCL and PANI ones were grouped in ordere...
متن کامل